AFM characterization methods

Advanced AFM characterization of nanometer scale devices

  • Multifrequency AFM to detect the eigen-modes of carbon nanotube mechanical resonators
  • Electromechanical AFM characterization at wafer-scale level
  • Measurement of stiffness and electrical and thermal conductivity at the nanoscale

Tecnology for the fabrication of functional AFM probes

  • Polymeric AFM probes
  • AFM Cantilevers with (insulated) conducting tips