Advanced AFM characterization of nanometer scale devices
- Multifrequency AFM to detect the eigen-modes of carbon nanotube mechanical resonators
- Electromechanical AFM characterization at wafer-scale level
- Measurement of stiffness and electrical and thermal conductivity at the nanoscale
Tecnology for the fabrication of functional AFM probes
- Polymeric AFM probes
- AFM Cantilevers with (insulated) conducting tips